Advanced International Journal for Research

E-ISSN: 3048-7641     Impact Factor: 9.11

A Widely Indexed Open Access Peer Reviewed Multidisciplinary Bi-monthly Scholarly International Journal

Call for Paper Volume 6, Issue 6 (November-December 2025) Submit your research before last 3 days of December to publish your research paper in the issue of November-December.

Surge Counter Testing Kit

Author(s) Prof. Puja Prakash Patil, Ms. Bhavana Sham Kumavat, Ms. Sriya Balkrushna Patil, Mr. Siddhesh Sanjay Zalte, Kaustubh Patil
Country India
Abstract Surge counters used in high-voltage systems must be tested for accuracy and reliability under standardized surge conditions. This paper presents the design and implementation of a dedicated and affordable testing setup capable of generating controlled high-voltage impulses for surge counter evaluation. The system develops a high-voltage surge generator capable of charging a 2 µF capacitor bank up to 4 kV using a 12V DC supply and simulates 8/20 µs lightning impulse waveforms using a triggered spark gap for realistic surge testing. The proposed system implements a high-voltage impulse generation system capable of producing standard 8/20 µs waveforms and accurately measures peak discharge current during impulse events using a digital peak hold metering system. The design incorporates an H-Bridge inverter topology with Sinusoidal PWM control, step-up transformation, and LC filtering techniques to achieve the required voltage levels. Simulation results using MATLAB/Simulink and Proteus validate the design approach, while hardware implementation using STM32 Blue Pill microcontroller, IR2110 MOSFET driver, and IRFZ44N MOSFETs demonstrates practical feasibility.
Keywords Surge Counter Testing, High Voltage Impulse Generation, Lightning Surge Simulation, HBridge Inverter, SPWM Control, Power Electronics, Capacitor Bank Charging.
Field Engineering
Published In Volume 6, Issue 6, November-December 2025
Published On 2025-11-01
DOI https://doi.org/10.63363/aijfr.2025.v06i06.1769
Short DOI https://doi.org/g99qqv

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